Cryogenic probe station with handling arm for non-destructive testing of the materials and equipments in electromagnetic field

Equipment ID : 17, Year of purchase : 2015, university ID : 7, type : equipment. The continuous refrigeration station uses either liquid helium and can be operated with liquid nitrogen. Landed probe tip movement up to 6 μm Superconducting magnet 25KOE (2.5T), vertical field Cryostat: 4.2°K la 400°K: with a 50W heating element Magnetic stage with 100W heating element Magnet radiation shield; main radiation shield with top view-port surrounds sample; outer second (partial) radiation shield Four temperature sensors Microscope with 7:1 optical zoom and cc colour camera Applications - Electrical and electro-optical measurements over a wide temperature range - RF and microwave - Parametric testing - Shielded/guarded/low noise characterization - High Z - Non-destructive, full wafer testing Materials Nano-scale electronics (carbon nano-tube transistors, single electron transistors, molecular electronics, nano-wires, etc.) Quantum wires and dots, quantum tunnelling Single electron tunneling (Coulomb blockade) Basic semiconductor devices including organics, LEDs, and dilute magnetic semiconductors.
Scientific domain

PE11: Materials Engineering


Keywords

Continuous refrigeration station


Home partner institution

University of Oradea


Equipment Cryogenic probe station
Description Equipment ID : 17, Year of purchase : 2015, university ID : 7, type : equipment. The continuous refrigeration station uses either liquid helium and can be operated with liquid nitrogen. Landed probe tip movement up to 6 μm Superconducting magnet 25KOE (2.5T), vertical field Cryostat: 4.2°K la 400°K: with a 50W heating element Magnetic stage with 100W heating element Magnet radiation shield; main radiation shield with top view-port surrounds sample; outer second (partial) radiation shield Four temperature sensors Microscope with 7:1 optical zoom and cc colour camera Applications - Electrical and electro-optical measurements over a wide temperature range - RF and microwave - Parametric testing - Shielded/guarded/low noise characterization - High Z - Non-destructive, full wafer testing Materials Nano-scale electronics (carbon nano-tube transistors, single electron transistors, molecular electronics, nano-wires, etc.) Quantum wires and dots, quantum tunnelling Single electron tunneling (Coulomb blockade) Basic semiconductor devices including organics, LEDs, and dilute magnetic semiconductors.