FEI Company’s QUANTA 3D FEG dual-system for environmental scanning electron microscopy and focused ion beam nanolithography (ESEM-FIB)

Scanning and transmission electron microscopy are among the most versatile techniques used in the study and analysis of the microstructural characteristics of solid objects. The technique involves directing a beam of electrons at the sample, which generates various types of signals; when captured by suitable detectors, these provide different kinds of information about the sample. Share on