Microcrystalline powder diffractometer

X-ray diffraction is the phenomenon whereby radiation is scattered by a crystalline sample in such a way that the scattered rays, which are in phase, produce constructive interference at certain angles, giving rise to diffracted rays. The wavelength of the X-rays used is of the same order of magnitude as the interatomic distances in the solids under study. Thus, for the diffraction phenomenon to occur, the difference in path lengths travelled by the scattered rays must be equal to an integer multiple of the wavelength, a condition given by Bragg’s law: nλ = 2dhkl·sinθ Share on