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Research Infrastructures 2
Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)
Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)
X-ray diffraction system for phase identification, crystallinity analysis, and structural characterization of powders and thin films.
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Name
Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)
Home partner institution
University of Angers
Website
https://sfrmatrix.univ-angers.fr/fr/plateaux/cristal.html
Technical staff available
Yes
Equipment
Bruker D8 Advance X-ray diffractometer