1. Research Infrastructures
  2. Four-Point Probe System

Four-Point Probe System

Offering main image Instrument for measuring electrical conductivity and sheet resistance of thin films.

Name

Four-Point Probe System

Scientific domain

Materials Science


 

Thin Films


 

Electronics


Keywords

Thin-films


 

Conductivity


 

Probe


Home partner institution

University of Angers


Website

https://sfrmatrix.univ-angers.fr/fr/plateaux/carma.html

Technical staff available

Yes

Equipment

Four-point probe conductivity measurement system