Cryogenic probe station with handling arm for non-destructive testing of the materials and equipments in electric field

Equipment ID : 18, University ID : 7, year of purchase : 2015, type : equipment. The continuous refrigeration station uses either liquid helium and can be operated with liquid nitrogen Designed to enable true 90° wafer probing on wafers up to 25 mm (1 in) in diameter. Landed probe tip movement up to 4 μm Superconducting magnet 10 KOE (1 T), horizontal field Cryostat: 4.2°K la 400°K: with a 50W heating element Magnetic stage with 100W heating element Magnet radiation shield; main radiation shield with top viewport surrounds sample; outer second (partial) radiation shield Five temperature sensors Microscope with 7:1 optical zoom and cc colour camera The sample stage facilitates multi-pin and GSG microwave probing during measurement of electrical, electro-optical, parametric, high Z, DC, RF, and microwave properties of materials and test devices. Especially ideal for superconductors, organics, graphene, and carbon nano-tubes, typical materials measured also include nano-scale electronics, quantum wires and dots, and semiconductors Share on