1. Research Infrastructures
  2. Scanning Electron Microscope FEI XL30

Scanning Electron Microscope FEI XL30

Offering main image Field emission SEM, EDAX analysis with EDS and EBSD for chemical analyses and crystallographic investigations

Name

Scanning Electron Microscope FEI XL30

Scientific domain

Materials Science


 

Biomedical Engineering


 

Mechanical Engineering


Keywords

Scanning electron microscopy


 

EDS


 

EBSD


 

Surface morphology


 

Microstructure analysis


 

Materials characterization


 

Imaging


Home partner institution

Otto von Guericke University Magdeburg


Website

https://cmma.ovgu.de/cmma/en/Services/Devices_+Instrumentation+and+Methods-p-128.html

Technical staff available

Yes

Remote access details

no remote access

Equipment

FEI XL30

Open access to updated information database

Yes

Online booking system details

https://www.supersaas.de/schedule/CMMA/FEG_FEI_XL30

Online booking system available

Yes