Scanning Electron Microscope FEI Scios DualBeam

SEM-FIB device for 3-dimensional examinations, EDAX analysis with EDS, WDS and EBSD for chemical analyses and crystallographic investigations, in-situ tensile/compression testing up to 5kN, in-situ heating stage up to 1000°C

Name

Scientific domain

Materials Science

Biomedical Engineering

Mechanical Engineering

Keywords

Scanning electron microscopy

Nanostructure characterization

Microanalysis

In-situ tensile testing and heating

EDS

EBSD

Home partner institution

Otto von Guericke University Magdeburg

Website

https://cmma.ovgu.de/cmma/en/Services/Devices_+Instrumentation+and+Methods-p-128.html

Technical staff available

Yes

Remote access details

no remote access

Equipment

FEI Scios DualBeam

Open access to updated information database

Yes

Online booking system details

https://www.supersaas.de/schedule/CMMA/DB_FEI_Scios

Online booking system available

Yes