Nano Indenter Agilent (Keysight) G200
The Nano Indenter G200 enables users to measure Young’s modulus and hardness in compliance with ISO 14577. The G200 also enables measurement of deformation over six orders of magnitude (from nano-meters to millimeters). Modular options can be added to accommodate a variety of applications. The capabilities of the G200 can be extended to facilitate frequency-specific testing, quantitative scratch and wear testing, integrated probe-based imaging, high-temperature testing, expanded load capacity up to 10N, and customizable test protocols.Name
Nano Indenter Agilent (Keysight) G200Keywords
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University of Oradea