X-ray fluorescence (EDX) equipment for field measurements. Titan S1 XRF gun

X-ray fluorescence spectrometry is a technique based on the detection of secondary X-rays produced following the electronic relaxation of elements previously excited by a primary X-ray source. Its main feature is that these secondary X-rays are characteristic of each element, a fact that enables elemental quantification of the sample under analysis. Furthermore, this technique is ‘non-destructive’ and in many cases allows for the analysis of both solid and liquid materials. Share on