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  2. FEI Company’s QUANTA 3D FEG dual-system for environmental scanning electron microscopy and focused ion beam nanolithography (ESEM-FIB)

FEI Company’s QUANTA 3D FEG dual-system for environmental scanning electron microscopy and focused ion beam nanolithography (ESEM-FIB)

Offering main image Scanning and transmission electron microscopy are among the most versatile techniques used in the study and analysis of the microstructural characteristics of solid objects. The technique involves directing a beam of electrons at the sample, which generates various types of signals; when captured by suitable detectors, these provide different kinds of information about the sample.

Name

FEI Company’s QUANTA 3D FEG dual-system for environmental scanning electron microscopy and focused ion beam nanolithography (ESEM-FIB)

Keywords

Research Facilities


Home partner institution

University of Extremadura


Website

https://saiuex.unex.es/servicios/sacss/microscopia-electronica/

Equipment

FEI Company’s QUANTA 3D FEG dual-system for environmental scanning electron microscopy and focused ion beam nanolithography (ESEM-FIB)

Online booking system details

Booking system details will be available after registration in the system.