TOF-SIMS.

TOF-SIMS The TOF-SIMS (time-of-flight secondary ion mass spectrometry) technique is based on bombarding a surface with primary ions. The interaction of these ions with the surface releases a cloud of neutral elements, ions, ionic fragments, electrons or clusters of elements; by applying a potential difference, this allows the selective extraction of the ions or ionic fragments characteristic of the surface under analysis. Detection using time-of-flight mass spectrometry allows the analysis of everything from ions belonging to elements to ionic fragments constituting macromolecules. In this regard, the analysis of mass spectra provides information on the constituent elements of the surface, such as molecules anchored to that surface and even their anchoring arrangement on it. The available equipment allows for operation in both static and dynamic modes. Share on