Field Emission Scanning Electron Microscope (JEOL 6301F)

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High-resolution SEM for nanoscale imaging and surface characterization.

Name

Field Emission Scanning Electron Microscope (JEOL 6301F)

Scientific domain

Imaging

Materials Science

Nanoscience

Keywords

SEM

Nanoscale

Field-emission

Home partner institution

University of Angers

Website

https://sfricat.univ-angers.fr/fr/plateformes/sciam.html

Technical staff available

Yes

Equipment

JEOL 6301F field emission SEM