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  1. Research Infrastructures 2
  2. Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)

Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)

Offering main image X-ray diffraction system for phase identification, crystallinity analysis, and structural characterization of powders and thin films.

Name

Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)

Scientific domain

Chemistry


 

Materials Science


 

Crystallography


Keywords

Thin-films


 

XRD


 

Powder


Home partner institution

University of Angers


Website

https://sfrmatrix.univ-angers.fr/fr/plateaux/cristal.html

Technical staff available

Yes

Equipment

Bruker D8 Advance X-ray diffractometer