Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)
X-ray diffraction system for phase identification, crystallinity analysis, and structural characterization of powders and thin films.Name
Powder and Thin Film X-ray Diffractometer (Bruker D8 Advance)Scientific domain
Chemistry
Materials Science
Crystallography
Keywords
thin-films
XRD
powder
Home partner institution
University of Angers